Author Topic: What kind of method that I can find defect about amorphous SiO2 material ?  (Read 75 times)

WU-CHUNG-YEN

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Dear all,
I confuse this question for a long time,
but I still don't know how to find defect of amorphous material?
I know that amorphous material defect is about free volume vacancy diffusion,
but I don't know how to find it in Ovito,
Is it possible to use Wigner-Seitz defect analysis?

Thanks all
best regards

Constanze Kalcher

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Re: What kind of method that I can find defect about amorphous SiO2 material ?
« Reply #1 on: November 23, 2018, 02:30:59 PM »
Hello,

I don't think the Wigner-Seitz defect analysis would be the right analysis tool for you, since it would require comparison to a (in your case amorphous) reference configuration.


~Constanze